Automated Defect and Correlation Length Analysis of Block Copolymer Thin Film Nanopatterns
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Title
Automated Defect and Correlation Length Analysis of Block Copolymer Thin Film Nanopatterns
Authors
Keywords
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Journal
PLoS One
Volume 10, Issue 7, Pages e0133088
Publisher
Public Library of Science (PLoS)
Online
2015-07-25
DOI
10.1371/journal.pone.0133088
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