Stress-induced patterns in ion-irradiated silicon: Model based on anisotropic plastic flow
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Title
Stress-induced patterns in ion-irradiated silicon: Model based on anisotropic plastic flow
Authors
Keywords
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Journal
PHYSICAL REVIEW B
Volume 86, Issue 23, Pages -
Publisher
American Physical Society (APS)
Online
2012-12-07
DOI
10.1103/physrevb.86.235405
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