Multiple scattering causes the low energy–low angle constant wavelength topographical instability of argon ion bombarded silicon surfaces

Published 2011 View Full Article

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Title
Multiple scattering causes the low energy–low angle constant wavelength topographical instability of argon ion bombarded silicon surfaces
Authors
Keywords
-
Journal
APPLIED SURFACE SCIENCE
Volume 258, Issue 9, Pages 4112-4115
Publisher
Elsevier BV
Online
2011-08-07
DOI
10.1016/j.apsusc.2011.07.143

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