Polarization effects in noncontact atomic force microscopy: A key to model the tip-sample interaction above charged adatoms

Method to calculate electric fields at very small tip-sample distances in atomic force microscopy

(2010) G. M. Sacha   APPLIED PHYSICS LETTERS

Bias Potential for Tip–Plane Systems in Kelvin Probe Force Microscopy Imaging of Non-uniform Surface Potential Distributions

(2010) Krzysztof Sajewicz et al.   JAPANESE JOURNAL OF APPLIED PHYSICS

Topography and work function measurements of thin MgO(001) films on Ag(001) by nc-AFM and KPFM

(2010) M. Bieletzki et al.   PHYSICAL CHEMISTRY CHEMICAL PHYSICS

Simulation method of Kelvin probe force microscopy at nanometer range and its application

(2010) A. Masago et al.   PHYSICAL REVIEW B

Atomic resolution on a metal single crystal with dynamic force microscopy

(2009) T. König et al.   APPLIED PHYSICS LETTERS

Measuring the Charge State of Point Defects on MgO/Ag(001)

(2009) T. König et al.   JOURNAL OF THE AMERICAN CHEMICAL SOCIETY

On the relevance of the atomic-scale contact potential difference by amplitude-modulation and frequency-modulation Kelvin probe force microscopy

(2009) Laurent Nony et al.   NANOTECHNOLOGY

Sublattice identification in noncontact atomic force microscopy of the NaCl(001) surface

(2009) R. Hoffmann et al.   PHYSICAL REVIEW B

New Insights on Atomic-Resolution Frequency-Modulation Kelvin-Probe Force-Microscopy Imaging of Semiconductors

(2009) Sascha Sadewasser et al.   PHYSICAL REVIEW LETTERS

Understanding the Atomic-Scale Contrast in Kelvin Probe Force Microscopy

(2009) Laurent Nony et al.   PHYSICAL REVIEW LETTERS

Measuring the Charge State of an Adatom with Noncontact Atomic Force Microscopy

(2009) L. Gross et al.   SCIENCE

Modeling electrostatic force microscopy for conductive and dielectric samples using the boundary element method

(2008) Y. Shen et al.   ENGINEERING ANALYSIS WITH BOUNDARY ELEMENTS

Lateral resolution and potential sensitivity in Kelvin probe force microscopy: Towards understanding of the sub-nanometer resolution

(2008) F. Krok et al.   PHYSICAL REVIEW B

Analytical approach to the local contact potential difference on (001) ionic surfaces: Implications for Kelvin probe force microscopy

(2008) Franck Bocquet et al.   PHYSICAL REVIEW B

Atomic Scale Kelvin Probe Force Microscopy Studies of the Surface Potential Variations on theTiO2(110)Surface

(2008) G. H. Enevoldsen et al.   PHYSICAL REVIEW LETTERS