Electrical stability of multilayer MoS2field-effect transistor under negative bias stress at various temperatures
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Title
Electrical stability of multilayer MoS2field-effect transistor under negative bias stress at various temperatures
Authors
Keywords
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Journal
Physica Status Solidi-Rapid Research Letters
Volume 8, Issue 8, Pages 714-718
Publisher
Wiley
Online
2014-06-06
DOI
10.1002/pssr.201409146
References
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Related references
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