Electrical stability of multilayer MoS2field-effect transistor under negative bias stress at various temperatures

标题
Electrical stability of multilayer MoS2field-effect transistor under negative bias stress at various temperatures
作者
关键词
-
出版物
Physica Status Solidi-Rapid Research Letters
Volume 8, Issue 8, Pages 714-718
出版商
Wiley
发表日期
2014-06-06
DOI
10.1002/pssr.201409146

向作者/读者发起求助以获取更多资源

Publish scientific posters with Peeref

Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.

Learn More

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search