Characterization of semiconductor materials using synchrotron radiation-based near-field infrared microscopy and nano-FTIR spectroscopy
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Title
Characterization of semiconductor materials using synchrotron radiation-based near-field infrared microscopy and nano-FTIR spectroscopy
Authors
Keywords
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Journal
OPTICS EXPRESS
Volume 22, Issue 15, Pages 17948
Publisher
The Optical Society
Online
2014-07-17
DOI
10.1364/oe.22.017948
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