Nanoscale residual stress-field mapping
around nanoindents in SiC
by IR s-SNOM and confocal Raman microscopy

Published 2009 View Full Article

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Title
Nanoscale residual stress-field mapping
around nanoindents in SiC
by IR s-SNOM and confocal Raman microscopy
Authors
Keywords
-
Journal
OPTICS EXPRESS
Volume 17, Issue 25, Pages 22351
Publisher
The Optical Society
Online
2009-11-24
DOI
10.1364/oe.17.022351

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