Imaging and strain analysis of nano-scale SiGe structures by tip-enhanced Raman spectroscopy

Published 2011 View Full Article

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Title
Imaging and strain analysis of nano-scale SiGe structures by tip-enhanced Raman spectroscopy
Authors
Keywords
-
Journal
ULTRAMICROSCOPY
Volume 111, Issue 11, Pages 1630-1635
Publisher
Elsevier BV
Online
2011-09-17
DOI
10.1016/j.ultramic.2011.08.009

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