Near-field spectroscopy of silicon dioxide thin films

Title
Near-field spectroscopy of silicon dioxide thin films
Authors
Keywords
-
Journal
PHYSICAL REVIEW B
Volume 85, Issue 7, Pages -
Publisher
American Physical Society (APS)
Online
2012-02-21
DOI
10.1103/physrevb.85.075419

Ask authors/readers for more resources

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now