Full-field microimaging with 8 keV X-rays achieves a spatial resolutions better than 20 nm

Title
Full-field microimaging with 8 keV X-rays achieves a spatial resolutions better than 20 nm
Authors
Keywords
-
Journal
OPTICS EXPRESS
Volume 19, Issue 21, Pages 19919
Publisher
The Optical Society
Online
2011-09-28
DOI
10.1364/oe.19.019919

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