Hard x-ray Zernike microscopy reaches 30 nm resolution

Title
Hard x-ray Zernike microscopy reaches 30 nm resolution
Authors
Keywords
-
Journal
OPTICS LETTERS
Volume 36, Issue 7, Pages 1269
Publisher
The Optical Society
Online
2011-03-30
DOI
10.1364/ol.36.001269

Ask authors/readers for more resources

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started