Hard-x-ray microscopy with Fresnel zone plates reaches 40nm Rayleigh resolution

Title
Hard-x-ray microscopy with Fresnel zone plates reaches 40nm Rayleigh resolution
Authors
Keywords
-
Journal
APPLIED PHYSICS LETTERS
Volume 92, Issue 10, Pages 103119
Publisher
AIP Publishing
Online
2008-03-13
DOI
10.1063/1.2857476

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