Atomic contact potential variations of Si(111)-7 × 7 analyzed by Kelvin probe force microscopy

Ultrasensitive detection of lateral atomic-scale interactions on graphite (0001) via bimodal dynamic force measurements

(2010) Shigeki Kawai et al.   PHYSICAL REVIEW B

Molecular assemblies grown between metallic contacts on insulating surfaces

(2009) Th. Glatzel et al.   APPLIED PHYSICS LETTERS

Surface-relaxation-induced giant corrugation on graphite (0001)

(2009) Shigeki Kawai et al.   PHYSICAL REVIEW B

Time-averaged cantilever deflection in dynamic force spectroscopy

(2009) Shigeki Kawai et al.   PHYSICAL REVIEW B

Systematic Achievement of Improved Atomic-Scale Contrast via Bimodal Dynamic Force Microscopy

(2009) Shigeki Kawai et al.   PHYSICAL REVIEW LETTERS

New Insights on Atomic-Resolution Frequency-Modulation Kelvin-Probe Force-Microscopy Imaging of Semiconductors

(2009) Sascha Sadewasser et al.   PHYSICAL REVIEW LETTERS

Measuring the Charge State of an Adatom with Noncontact Atomic Force Microscopy

(2009) L. Gross et al.   SCIENCE

Molecular Assemblies on Insulating Ultrathin Films Analyzed by NC-AFM and KPFM

(2008) Thilo Glatzel et al.   ISRAEL JOURNAL OF CHEMISTRY

Lateral resolution and potential sensitivity in Kelvin probe force microscopy: Towards understanding of the sub-nanometer resolution

(2008) F. Krok et al.   PHYSICAL REVIEW B

Analytical approach to the local contact potential difference on (001) ionic surfaces: Implications for Kelvin probe force microscopy

(2008) Franck Bocquet et al.   PHYSICAL REVIEW B

Atomic Scale Kelvin Probe Force Microscopy Studies of the Surface Potential Variations on theTiO2(110)Surface

(2008) G. H. Enevoldsen et al.   PHYSICAL REVIEW LETTERS