期刊
NANOTECHNOLOGY
卷 21, 期 24, 页码 -出版社
IOP PUBLISHING LTD
DOI: 10.1088/0957-4484/21/24/245704
关键词
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资金
- Swiss National Center of Competence in Research on Nanoscale Science, Pico-Inside
- National Science Foundation
We studied atomic contact potential variations of Si(111)-7 x 7 by Kelvin probe force microscopy with the amplitude modulation technique at the second resonance of a silicon cantilever. Enhanced sensitivity due to the high mechanical quality factor in ultra-high vacuum enabled local contact potential difference (LCPD) measurements of individual adatoms. The contrast of the measured LCPD map became stronger by reducing the tip-sample distance, and the averaged LCPD value shifted to more negative. The short-range interaction, arising from the covalent bonding interactions, strongly affects the LCPD measurement. Theoretical calculations indicate that the amplitude modulation method has a higher sensitivity than the frequency modulation method in practical cases. The tip-sample distance dependence of LCPD was investigated by numerical calculations.
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