Grain boundary segregation in multicrystalline silicon: correlative characterization by EBSD, EBIC, and atom probe tomography

Title
Grain boundary segregation in multicrystalline silicon: correlative characterization by EBSD, EBIC, and atom probe tomography
Authors
Keywords
-
Journal
PROGRESS IN PHOTOVOLTAICS
Volume 23, Issue 12, Pages 1742-1753
Publisher
Wiley
Online
2015-05-08
DOI
10.1002/pip.2614

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