Grain boundary segregation in multicrystalline silicon: correlative characterization by EBSD, EBIC, and atom probe tomography
Published 2015 View Full Article
- Home
- Publications
- Publication Search
- Publication Details
Title
Grain boundary segregation in multicrystalline silicon: correlative characterization by EBSD, EBIC, and atom probe tomography
Authors
Keywords
-
Journal
PROGRESS IN PHOTOVOLTAICS
Volume 23, Issue 12, Pages 1742-1753
Publisher
Wiley
Online
2015-05-08
DOI
10.1002/pip.2614
References
Ask authors/readers for more resources
Related references
Note: Only part of the references are listed.- Combining structural and chemical information at the nanometer scale by correlative transmission electron microscopy and atom probe tomography
- (2015) M. Herbig et al. ULTRAMICROSCOPY
- Nickel distribution and recombination activity in as-grown and annealed multicrystalline silicon
- (2014) Takuto Kojima et al. JAPANESE JOURNAL OF APPLIED PHYSICS
- Kikuchi bandlet method for the accurate deconvolution and localization of Kikuchi bands in Kikuchi diffraction patterns
- (2014) Farangis Ram et al. JOURNAL OF APPLIED CRYSTALLOGRAPHY
- Three-dimensional evaluation of gettering ability of Σ3{111} grain boundaries in silicon by atom probe tomography combined with transmission electron microscopy
- (2013) Yutaka Ohno et al. APPLIED PHYSICS LETTERS
- Electron microscope verification of prebreakdown-inducing α-FeSi2 needles in multicrystalline silicon solar cells
- (2013) A. Hähnel et al. JOURNAL OF APPLIED PHYSICS
- Development of high-performance multicrystalline silicon for photovoltaic industry
- (2013) Y. M. Yang et al. PROGRESS IN PHOTOVOLTAICS
- Element-Resolved Corrosion Analysis of Stainless-Type Glass-Forming Steels
- (2013) M. J. Duarte et al. SCIENCE
- Grain boundary investigations on sulfurized Cu(In,Ga)(S,Se)2 solar cells using atom probe tomography
- (2013) J. Keller et al. SOLAR ENERGY MATERIALS AND SOLAR CELLS
- Atom Probe Tomography 2012
- (2012) Thomas F. Kelly et al. Annual Review of Materials Research
- Exploring the p-n junction region in Cu(In,Ga)Se2 thin-film solar cells at the nanometer-scale
- (2012) O. Cojocaru-Mirédin et al. APPLIED PHYSICS LETTERS
- Recombination via point defects and their complexes in solar silicon
- (2012) A. R. Peaker et al. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE
- Defect generation, advanced crystallization, and characterization methods for high-quality solar-cell silicon
- (2012) Marisa Di Sabatino et al. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE
- Analyses of the Evolution of Iron-Silicide Precipitates in Multicrystalline Silicon During Solar Cell Processing
- (2012) Jonas Schön et al. IEEE Journal of Photovoltaics
- Impact of Metal Contamination in Silicon Solar Cells
- (2011) Gianluca Coletti et al. ADVANCED FUNCTIONAL MATERIALS
- A reproducible method for damage-free site-specific preparation of atom probe tips from interfaces
- (2011) Peter Johann Felfer et al. MICROSCOPY RESEARCH AND TECHNIQUE
- Correlating internal stresses, electrical activity and defect structure on the micrometer scale in EFG silicon ribbons
- (2011) G. Sarau et al. SOLAR ENERGY MATERIALS AND SOLAR CELLS
- Pragmatic reconstruction methods in atom probe tomography
- (2011) F. Vurpillot et al. ULTRAMICROSCOPY
- Atom probe study of sodium distribution in polycrystalline Cu(In,Ga)Se2 thin film
- (2010) E. Cadel et al. ACTA MATERIALIA
- Infrared birefringence imaging of residual stress and bulk defects in multicrystalline silicon
- (2010) Vidya Ganapati et al. JOURNAL OF APPLIED PHYSICS
- Microstructures of Si multicrystals and their impact on minority carrier diffusion length
- (2009) H.Y. Wang et al. ACTA MATERIALIA
- Structural characterization and iron detection at Σ3 grain boundaries in multicrystalline silicon
- (2009) Bin Chen et al. JOURNAL OF APPLIED PHYSICS
- Investigations of field-evaporated end forms in voltage- and laser-pulsed atom probe tomography
- (2008) A. Shariq et al. ULTRAMICROSCOPY
Publish scientific posters with Peeref
Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.
Learn MoreBecome a Peeref-certified reviewer
The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.
Get Started