SIMS of organics—Advances in 2D and 3D imaging and future outlook

Intracellular Drug Concentrations

(2013) C T Dollery   CLINICAL PHARMACOLOGY & THERAPEUTICS

Computer Simulations of the Sputtering of Metallic, Organic, and Metal–Organic Surfaces with Bin and C60 Projectiles

(2013) A. Delcorte et al.   Journal of Physical Chemistry C

Nanoscale imaging reveals laterally expanding antimicrobial pores in lipid bilayers

(2013) P. D. Rakowska et al.   PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA

Argon Cluster Ion Beams for Organic Depth Profiling: Results from a VAMAS Interlaboratory Study

(2012) Alexander G. Shard et al.   ANALYTICAL CHEMISTRY

Secondary Ion Mass Spectrometry: Characterizing Complex Samples in Two and Three Dimensions

(2012) John S. Fletcher et al.   ANALYTICAL CHEMISTRY

ToF-SIMS Depth Profiling of Cells:z-Correction, 3D Imaging, and Sputter Rate of Individual NIH/3T3 Fibroblasts

(2012) Michael A. Robinson et al.   ANALYTICAL CHEMISTRY

Multivariate Analysis of ToF-SIMS Data from Multicomponent Systems: The Why, When, and How

(2012) Daniel J. Graham et al.   Biointerphases

Label-Free Live-Cell Imaging of Nucleic Acids Using Stimulated Raman Scattering Microscopy

(2012) Xu Zhang et al.   CHEMPHYSCHEM

SIMS imaging of the nanoworld: applications in science and technology

(2012) Mathias Senoner et al.   JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY

Chemical and spatial analysis of protein loaded PLGA microspheres for drug delivery applications

(2012) A. Rafati et al.   JOURNAL OF CONTROLLED RELEASE

Sputtering Yields for Gold Using Argon Gas Cluster Ion Beams

(2012) Li Yang et al.   Journal of Physical Chemistry C

Sputtering Yields of Gold Nanoparticles by C60 Ions

(2012) Li Yang et al.   Journal of Physical Chemistry C

Argon Cluster Sputtering of a Hybrid Metal–Organic Surface: A Microscopic View

(2012) Oscar A. Restrepo et al.   Journal of Physical Chemistry C

High Speed Data Processing for Imaging MS-Based Molecular Histology Using Graphical Processing Units

(2012) Emrys A. Jones et al.   JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY

Vacuum electrospray of volatile liquids assisted by infrared laser irradiation

(2012) Satoshi Ninomiya et al.   RAPID COMMUNICATIONS IN MASS SPECTROMETRY

Identification and separation of protein, contaminant and substrate peaks using gentle-secondary ion mass spectrometry and theg-ogram

(2012) Satoka Aoyagi et al.   RAPID COMMUNICATIONS IN MASS SPECTROMETRY

Ultra high spatial resolution SIMS with cluster ions - approaching the physical limits

(2012) Felix Kollmer et al.   SURFACE AND INTERFACE ANALYSIS

SIMS informatics

(2012) Alex Henderson et al.   SURFACE AND INTERFACE ANALYSIS

Molecular imaging and depth profiling by mass spectrometry—SIMS, MALDI or DESI?

(2011) John C. Vickerman   ANALYST

Mass Spectrometry and Informatics: Distribution of Molecules in the PubChem Database and General Requirements for Mass Accuracy in Surface Analysis

(2011) F. M. Green et al.   ANALYTICAL CHEMISTRY

Surface Mass Spectrometry of Two Component Drug–Polymer Systems: Novel Chromatographic Separation Method Using Gentle-Secondary Ion Mass Spectrometry (G-SIMS)

(2011) Ryosuke Ogaki et al.   ANALYTICAL CHEMISTRY

Study of the desorption/ionization mechanism in electrospray droplet impact secondary ion mass spectrometry

(2011) Daiki Asakawa et al.   RAPID COMMUNICATIONS IN MASS SPECTROMETRY

Three-dimensional mass spectral imaging of HeLa-M cells - sample preparation, data interpretation and visualisation

(2011) John S. Fletcher et al.   RAPID COMMUNICATIONS IN MASS SPECTROMETRY

Surface characterization and depth profiling of biological molecules by electrospray droplet impact/SIMS

(2011) Daiki Asakawa et al.   SURFACE AND INTERFACE ANALYSIS

Linearity of the instrumental intensity scale in TOF-SIMS-a VAMAS interlaboratory study

(2011) J. L. S. Lee et al.   SURFACE AND INTERFACE ANALYSIS

Matrix-Enhanced Secondary Ion Mass Spectrometry (ME SIMS) Using Room Temperature Ionic Liquid Matrices

(2010) Jennifer J. D. Fitzgerald et al.   ANALYTICAL CHEMISTRY

In silico fragmentation for computer assisted identification of metabolite mass spectra

(2010) Sebastian Wolf et al.   BMC BIOINFORMATICS

Imaging surface analysis: Lateral resolution and its relation to contrast and noise

(2010) Mathias Senoner et al.   JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY

Lipid mapping of colonic mucosa by cluster TOF-SIMS imaging and multivariate analysis incftrknockout mice

(2010) Marc Brulet et al.   JOURNAL OF LIPID RESEARCH

MassBank: a public repository for sharing mass spectral data for life sciences

(2010) Hisayuki Horai et al.   JOURNAL OF MASS SPECTROMETRY

Cluster primary ion sputtering: correlations in secondary ion intensities in TOF SIMS

(2010) M. P. Seah et al.   SURFACE AND INTERFACE ANALYSIS

Analysis of organic semiconductor multilayers with Ar cluster secondary ion mass spectrometry

(2010) Satoshi Ninomiya et al.   SURFACE AND INTERFACE ANALYSIS

ToF-SIMS depth profiling of trehalose: the effect of analysis beam dose on the quality of depth profiles

(2010) Shin Muramoto et al.   SURFACE AND INTERFACE ANALYSIS

Molecular ion yield enhancement in static secondary ion mass spectrometry by soft landing of protonated water clusters

(2010) Guangtao Li et al.   SURFACE AND INTERFACE ANALYSIS

Static SIMS-VAMAS interlaboratory study for intensity repeatability, mass scale accuracy and relative quantification

(2010) F. M. Green et al.   SURFACE AND INTERFACE ANALYSIS

A new time-of-flight SIMS instrument for 3D imaging and analysis

(2010) Rowland Hill et al.   SURFACE AND INTERFACE ANALYSIS

A new SIMS paradigm for 2D and 3D molecular imaging of bio-systems

(2009) John S. Fletcher et al.   ANALYTICAL AND BIOANALYTICAL CHEMISTRY

Mass spectrometry imaging of rat brain sections: nanomolar sensitivity with MALDI versus nanometer resolution by TOF–SIMS

(2009) Farida Benabdellah et al.   ANALYTICAL AND BIOANALYTICAL CHEMISTRY

Three-Dimensional Time-of-Flight Secondary Ion Mass Spectrometry Imaging of a Pharmaceutical in a Coronary Stent Coating as a Function of Elution Time

(2009) Gregory L. Fisher et al.   ANALYTICAL CHEMISTRY

Light and Molecular Ions: The Emergence of Vacuum UV Single-Photon Ionization in MS

(2009) Luke Hanley et al.   ANALYTICAL CHEMISTRY

Organic Depth Profiling of a Nanostructured Delta Layer Reference Material Using Large Argon Cluster Ions

(2009) J. L. S. Lee et al.   ANALYTICAL CHEMISTRY

Proteomics by Mass Spectrometry: Approaches, Advances, and Applications

(2009) John R. Yates et al.   Annual Review of Biomedical Engineering

Organic Depth Profiling of a Binary System: the Compositional Effect on Secondary Ion Yield and a Model for Charge Transfer during Secondary Ion Emission

(2009) Alexander G. Shard et al.   JOURNAL OF PHYSICAL CHEMISTRY B

Sample Cooling or Rotation Improves C60Organic Depth Profiles of Multilayered Reference Samples: Results from a VAMAS Interlaboratory Study

(2009) P. Sjövall et al.   JOURNAL OF PHYSICAL CHEMISTRY B

Cluster Primary Ion Sputtering: Secondary Ion Intensities in Static SIMS of Organic Materials

(2009) M. P. Seah et al.   Journal of Physical Chemistry C

Cluster secondary ion mass spectrometry of polymers and related materials

(2009) Christine M. Mahoney   MASS SPECTROMETRY REVIEWS

G-SIMS: relative effectiveness of different monatomic primary ion source combinations

(2009) Martin P. Seah et al.   RAPID COMMUNICATIONS IN MASS SPECTROMETRY

Precise and fast secondary ion mass spectrometry depth profiling of polymer materials with large Ar cluster ion beams

(2009) Satoshi Ninomiya et al.   RAPID COMMUNICATIONS IN MASS SPECTROMETRY

Multivariate image analysis strategies for ToF-SIMS images with topography

(2009) J. L. S. Lee et al.   SURFACE AND INTERFACE ANALYSIS

Effects of Metal Nanoparticles on the Secondary Ion Yields of a Model Alkane Molecule upon Atomic and Polyatomic Projectiles in Secondary Ion Mass Spectrometry

(2008) Nimer Wehbe et al.   ANALYTICAL CHEMISTRY

A New Dynamic in Mass Spectral Imaging of Single Biological Cells

(2008) John S. Fletcher et al.   ANALYTICAL CHEMISTRY

SIRIUS: decomposing isotope patterns for metabolite identification†

(2008) Sebastian Böcker et al.   BIOINFORMATICS

Identification of complex molecules at surfaces: G-SIMS and SMILES fragmentation pathways

(2008) F.M. Green et al.   INTERNATIONAL JOURNAL OF MASS SPECTROMETRY

Quantitative Molecular Depth Profiling of Organic Delta-Layers by C60Ion Sputtering and SIMS†

(2008) Alexander G. Shard et al.   JOURNAL OF PHYSICAL CHEMISTRY B

Imaging G-SIMS: a novel bismuth-manganese source emitter

(2008) Felicia M. Green et al.   RAPID COMMUNICATIONS IN MASS SPECTROMETRY

Quantification and methodology issues in multivariate analysis of ToF-SIMS data for mixed organic systems

(2008) J. L. S. Lee et al.   SURFACE AND INTERFACE ANALYSIS