Cluster primary ion sputtering: correlations in secondary ion intensities in TOF SIMS
Published 2010 View Full Article
- Home
- Publications
- Publication Search
- Publication Details
Title
Cluster primary ion sputtering: correlations in secondary ion intensities in TOF SIMS
Authors
Keywords
-
Journal
SURFACE AND INTERFACE ANALYSIS
Volume 43, Issue 1-2, Pages 228-235
Publisher
Wiley
Online
2010-06-22
DOI
10.1002/sia.3491
References
Ask authors/readers for more resources
Related references
Note: Only part of the references are listed.- Dynamics of Molecular Impacts on Soft Materials: From Fullerenes to Organic Nanodrops
- (2009) A. Delcorte et al. ANALYTICAL CHEMISTRY
- Organic Depth Profiling of a Nanostructured Delta Layer Reference Material Using Large Argon Cluster Ions
- (2009) J. L. S. Lee et al. ANALYTICAL CHEMISTRY
- Cluster Primary Ion Sputtering: Secondary Ion Intensities in Static SIMS of Organic Materials
- (2009) M. P. Seah et al. Journal of Physical Chemistry C
- Relationships between cluster secondary ion mass intensities generated by different cluster primary ions
- (2009) Martin P. Seah et al. JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY
- Deconvolution analyses of secondary ion mass spectrometry shallow depth profiles with depth resolution functions from silicon substrate-based delta-doped samples
- (2009) Mitsuhiro Tomita et al. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
- G-SIMS: relative effectiveness of different monatomic primary ion source combinations
- (2009) Martin P. Seah et al. RAPID COMMUNICATIONS IN MASS SPECTROMETRY
- Molecular SIMS – A journey from single crystal to biological surface studies
- (2009) John C. Vickerman SURFACE SCIENCE
- G-SIMS and SMILES: Simulated fragmentation pathways for identification of complex molecules, amino acids and peptides
- (2008) F.M. Green et al. APPLIED SURFACE SCIENCE
- MD simulation study of the sputtering process by high-energy gas cluster impact
- (2008) Takaaki Aoki et al. APPLIED SURFACE SCIENCE
- Molecular depth profiling of polymers with very low energy ions
- (2008) L. Houssiau et al. APPLIED SURFACE SCIENCE
- Angle of incidence effects in a molecular solid
- (2008) Kathleen E. Ryan et al. APPLIED SURFACE SCIENCE
- Sputtering of organic molecules by clusters, with focus on fullerenes
- (2008) A. Delcorte et al. APPLIED SURFACE SCIENCE
- Cluster SIMS using metal cluster complex ions
- (2008) Yukio Fujiwara et al. APPLIED SURFACE SCIENCE
- Artifacts in the sputtering of inorganics by C60n+
- (2008) J.L.S. Lee et al. APPLIED SURFACE SCIENCE
- Depth profiling of organic materials using improved ion beam conditions
- (2008) H.-G. Cramer et al. APPLIED SURFACE SCIENCE
- Sputtering of nanoparticles: Molecular dynamics study of Au impact on 20nm sized Au nanoparticles
- (2008) Steffen Zimmermann et al. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY
- Quantitative Molecular Depth Profiling of Organic Delta-Layers by C60Ion Sputtering and SIMS†
- (2008) Alexander G. Shard et al. JOURNAL OF PHYSICAL CHEMISTRY B
- Imaging G-SIMS: a novel bismuth-manganese source emitter
- (2008) Felicia M. Green et al. RAPID COMMUNICATIONS IN MASS SPECTROMETRY
Add your recorded webinar
Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.
Upload NowCreate your own webinar
Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.
Create Now