Journal
SURFACE AND INTERFACE ANALYSIS
Volume 43, Issue 1-2, Pages 498-501Publisher
WILEY-BLACKWELL
DOI: 10.1002/sia.3161
Keywords
static SIMS; protonated water clusters; soft landing; molecular ion; ionization efficiency; surface charging
Categories
Funding
- Office of Science, Office of Basic Energy Sciences, of the US Department of Energy [DE-FG02-06ER15807]
Ask authors/readers for more resources
An effective online method for molecular ion yield enhancement in static secondary ion mass spectrometry (SIMS) is demonstrated using a custom-built soft landing (SL) instrument equipped with SIMS capabilities. Dramatic molecular ion yield enhancement has been observed for amino acids and peptides on silica substrates after soft landing a mixture of protonated water clusters [H(H2O)(n)](+) (n = 4 to >100). Image current measurements and experiments on semiconducting and metal substrates confirmed that protonation of the analyte molecule and effective charge retention on the substrate is the reason for the observed phenomenon. Enhancement could also be observed-less conveniently-by offline treatment of the surface using electrospray deposition of 2% acetic acid in methanol/water solution. Copyright (C) 2010 John Wiley & Sons, Ltd.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available