4.2 Article Proceedings Paper

Molecular ion yield enhancement in static secondary ion mass spectrometry by soft landing of protonated water clusters

Journal

SURFACE AND INTERFACE ANALYSIS
Volume 43, Issue 1-2, Pages 498-501

Publisher

WILEY-BLACKWELL
DOI: 10.1002/sia.3161

Keywords

static SIMS; protonated water clusters; soft landing; molecular ion; ionization efficiency; surface charging

Funding

  1. Office of Science, Office of Basic Energy Sciences, of the US Department of Energy [DE-FG02-06ER15807]

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An effective online method for molecular ion yield enhancement in static secondary ion mass spectrometry (SIMS) is demonstrated using a custom-built soft landing (SL) instrument equipped with SIMS capabilities. Dramatic molecular ion yield enhancement has been observed for amino acids and peptides on silica substrates after soft landing a mixture of protonated water clusters [H(H2O)(n)](+) (n = 4 to >100). Image current measurements and experiments on semiconducting and metal substrates confirmed that protonation of the analyte molecule and effective charge retention on the substrate is the reason for the observed phenomenon. Enhancement could also be observed-less conveniently-by offline treatment of the surface using electrospray deposition of 2% acetic acid in methanol/water solution. Copyright (C) 2010 John Wiley & Sons, Ltd.

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