Comparison of methods to determine bandgaps of ultrathin HfO2 films using spectroscopic ellipsometry

Complete band offset characterization of the HfO2/SiO2/Si stack using charge corrected x-ray photoelectron spectroscopy

(2010) E. Bersch et al.   JOURNAL OF APPLIED PHYSICS

Size-effects on the optical properties of zirconium oxide thin films

(2009) C. V. Ramana et al.   APPLIED PHYSICS LETTERS

Structure and optical properties of HfO2 thin films on silicon after rapid thermal annealing

(2009) Tingting Tan et al.   OPTICAL MATERIALS

Change in band alignment of HfO[sub 2] films with annealing treatments

(2008) C. J. Yim et al.   APPLIED PHYSICS LETTERS

The relationship between local order, long range order, and sub-band-gap defects in hafnium oxide and hafnium silicate films

(2008) D. H. Hill et al.   JOURNAL OF APPLIED PHYSICS

Electrochemical Durability of Carbon Nanostructures as Catalyst Support for PEMFCs

(2008) Sadesh Kumar Natarajan et al.   JOURNAL OF THE ELECTROCHEMICAL SOCIETY

Quantum confinement in amorphous TiO2films studied via atomic layer deposition

(2008) David M King et al.   NANOTECHNOLOGY

Band offsets of ultrathin high-κoxide films with Si

(2008) Eric Bersch et al.   PHYSICAL REVIEW B

Optical characterization of HfO2 by spectroscopic ellipsometry: Dispersion models and direct data inversion

(2008) Jordi Sancho-Parramon et al.   THIN SOLID FILMS