Optical characterization of HfO2 by spectroscopic ellipsometry: Dispersion models and direct data inversion

Title
Optical characterization of HfO2 by spectroscopic ellipsometry: Dispersion models and direct data inversion
Authors
Keywords
-
Journal
THIN SOLID FILMS
Volume 516, Issue 22, Pages 7990-7995
Publisher
Elsevier BV
Online
2008-04-12
DOI
10.1016/j.tsf.2008.04.007

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