Direct fabrication of thin layer MoS2 field-effect nanoscale transistors by oxidation scanning probe lithography

Title
Direct fabrication of thin layer MoS2 field-effect nanoscale transistors by oxidation scanning probe lithography
Authors
Keywords
-
Journal
APPLIED PHYSICS LETTERS
Volume 106, Issue 10, Pages 103503
Publisher
AIP Publishing
Online
2015-03-12
DOI
10.1063/1.4914349

Ask authors/readers for more resources

Add your recorded webinar

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started