Correlative analysis of conducting filament distribution at interfaces and bias-dependent noise sources in TiN/TiOx/Pt and Pt/TiOx/TiOy/Pt bipolar resistive switching frames
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Title
Correlative analysis of conducting filament distribution at interfaces and bias-dependent noise sources in TiN/TiOx/Pt and Pt/TiOx/TiOy/Pt bipolar resistive switching frames
Authors
Keywords
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Journal
APPLIED PHYSICS LETTERS
Volume 106, Issue 3, Pages 033506
Publisher
AIP Publishing
Online
2015-01-23
DOI
10.1063/1.4906532
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