4.6 Article

Photo-resist stripping process using atmospheric micro-plasma system

Journal

JOURNAL OF PHYSICS D-APPLIED PHYSICS
Volume 42, Issue 13, Pages -

Publisher

IOP PUBLISHING LTD
DOI: 10.1088/0022-3727/42/13/135201

Keywords

-

Funding

  1. Chi-Mei Optoelectronics [97S062]
  2. United Microelectronics Corporation [945156]
  3. National Cheng Kung University [D97-2700, D97-2740]

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A capillary electrode based micro-plasma system was utilized to evaluate the photo-resist stripping effect. Argon and nitrogen micro-plasmas were, respectively, employed as the working gas and ignited under atmospheric pressure. The result showed that the latter system required a much higher breakdown voltage than the former one to keep the micro-plasma in a steady state. Nitrogen micro-plasma with the inclusion of atmospheric oxygen was relatively rich in N, O-containing varieties, which thereafter induced complex reactions, e. g. by forming C-N,O structures, with the chemical substances on the photo-resist surface and required extensive treatment time to complete the photo-resist stripping process. In contrast, the use of atmospheric argon micro-plasma was very successful in increasing the photo-resist stripping rate. It is presumable that for this particular process, a simple physical effect with reduced reaction steps is highly proficient in removing photo-resist molecules from the substrate. One may therefore adjust the composition of atmospheric micro-plasma for an effective treatment on a coating.

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