Investigation of the effects of interface carrier concentration on ZnO thin film transistors fabricated by atomic layer deposition

Title
Investigation of the effects of interface carrier concentration on ZnO thin film transistors fabricated by atomic layer deposition
Authors
Keywords
-
Journal
JOURNAL OF PHYSICS D-APPLIED PHYSICS
Volume 42, Issue 23, Pages 235102
Publisher
IOP Publishing
Online
2009-11-10
DOI
10.1088/0022-3727/42/23/235102

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