EBSD Investigation of Cu-Sn IMC Microstructural Evolution in Cu/Sn-Ag/Cu Microbumps During Isothermal Annealing

Title
EBSD Investigation of Cu-Sn IMC Microstructural Evolution in Cu/Sn-Ag/Cu Microbumps During Isothermal Annealing
Authors
Keywords
Cu-bump-on-line (CuBOL), EBSD, orientation, Cu<sub>6</sub>Sn<sub>5</sub>, Cu<sub>3</sub>Sn
Journal
JOURNAL OF ELECTRONIC MATERIALS
Volume 43, Issue 1, Pages 219-228
Publisher
Springer Nature
Online
2013-09-18
DOI
10.1007/s11664-013-2675-z

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