Vertical leakage mechanism in GaN on Si high electron mobility transistor buffer layers

Title
Vertical leakage mechanism in GaN on Si high electron mobility transistor buffer layers
Authors
Keywords
-
Journal
JOURNAL OF APPLIED PHYSICS
Volume 124, Issue 5, Pages 055702
Publisher
AIP Publishing
Online
2018-08-04
DOI
10.1063/1.5027680

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