Vertical leakage mechanism in GaN on Si high electron mobility transistor buffer layers
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Title
Vertical leakage mechanism in GaN on Si high electron mobility transistor buffer layers
Authors
Keywords
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Journal
JOURNAL OF APPLIED PHYSICS
Volume 124, Issue 5, Pages 055702
Publisher
AIP Publishing
Online
2018-08-04
DOI
10.1063/1.5027680
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Related references
Note: Only part of the references are listed.- Electric Field Reduction in C-Doped AlGaN/GaN on Si High Electron Mobility Transistors
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- (2013) Puneet Srivastava et al. IEEE TRANSACTIONS ON ELECTRON DEVICES
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- (2013) A. Pérez-Tomás et al. JOURNAL OF APPLIED PHYSICS
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- (2012) S. A. Chevtchenko et al. APPLIED PHYSICS LETTERS
- Buffer Design to Minimize Current Collapse in GaN/AlGaN HFETs
- (2012) Michael J. Uren et al. IEEE TRANSACTIONS ON ELECTRON DEVICES
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- (2010) Nariaki Ikeda et al. PROCEEDINGS OF THE IEEE
- Influence of Deep Pits on the Breakdown of Metalorganic Chemical Vapor Deposition Grown AlGaN/GaN High Electron Mobility Transistors on Silicon
- (2009) S. Lawrence Selvaraj et al. Applied Physics Express
- Scanning capacitance microscopy studies of unintentional doping in epitaxial lateral overgrowth GaN
- (2009) J. Sumner et al. JOURNAL OF APPLIED PHYSICS
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- (2009) Samantha C. Cruz et al. JOURNAL OF CRYSTAL GROWTH
- Assessment of the performance of scanning capacitance microscopy for n-type gallium nitride
- (2008) J. Sumner et al. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
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- (2008) Rachel A Oliver REPORTS ON PROGRESS IN PHYSICS
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