Analyzing the influence of negative gate bias stress on the transconductance of solution-processed, organic thin-film transistors

Title
Analyzing the influence of negative gate bias stress on the transconductance of solution-processed, organic thin-film transistors
Authors
Keywords
-
Journal
JOURNAL OF APPLIED PHYSICS
Volume 116, Issue 7, Pages 074507
Publisher
AIP Publishing
Online
2014-08-21
DOI
10.1063/1.4893317

Ask authors/readers for more resources

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started