Analyzing the influence of negative gate bias stress on the transconductance of solution-processed, organic thin-film transistors
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Title
Analyzing the influence of negative gate bias stress on the transconductance of solution-processed, organic thin-film transistors
Authors
Keywords
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Journal
JOURNAL OF APPLIED PHYSICS
Volume 116, Issue 7, Pages 074507
Publisher
AIP Publishing
Online
2014-08-21
DOI
10.1063/1.4893317
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