Origin of bias stress induced instability of contact resistance in organic thin film transistors

Published 2011 View Full Article

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Title
Origin of bias stress induced instability of contact resistance in organic thin film transistors
Authors
Keywords
-
Journal
ORGANIC ELECTRONICS
Volume 12, Issue 5, Pages 823-826
Publisher
Elsevier BV
Online
2011-03-05
DOI
10.1016/j.orgel.2011.02.019

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