Structural and band alignment properties of Al2O3 on epitaxial Ge grown on (100), (110), and (111)A GaAs substrates by molecular beam epitaxy

Title
Structural and band alignment properties of Al2O3 on epitaxial Ge grown on (100), (110), and (111)A GaAs substrates by molecular beam epitaxy
Authors
Keywords
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Journal
JOURNAL OF APPLIED PHYSICS
Volume 113, Issue 13, Pages 134311
Publisher
AIP Publishing
Online
2013-04-06
DOI
10.1063/1.4799367

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