Insight on the SU-8 resist as passivation layer for transparent Ga2O3–In2O3–ZnO thin-film transistors

Gate-bias stress in amorphous oxide semiconductors thin-film transistors

(2009) M. E. Lopes et al.   APPLIED PHYSICS LETTERS

Toward High-Performance Amorphous GIZO TFTs

(2009) P. Barquinha et al.   JOURNAL OF THE ELECTROCHEMICAL SOCIETY

Current versus gate voltage hysteresis in organic field effect transistors

(2009) Martin Egginger et al.   MONATSHEFTE FUR CHEMIE

The influence of hard-baking temperature applied for SU8 sensor layer on the sensitivity of capacitive chemical sensor

(2008) Marta Klanjšek Gunde et al.   APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING

Origin of threshold voltage instability in indium-gallium-zinc oxide thin film transistors

(2008) Jae Kyeong Jeong et al.   APPLIED PHYSICS LETTERS

High-performance amorphous gallium indium zinc oxide thin-film transistors through N2O plasma passivation

(2008) Jaechul Park et al.   APPLIED PHYSICS LETTERS

Electronic transport properties of amorphous indium-gallium-zinc oxide semiconductor upon exposure to water

(2008) Jin-Seong Park et al.   APPLIED PHYSICS LETTERS

Stable ZnO thin film transistors by fast open air atomic layer deposition

(2008) David H. Levy et al.   APPLIED PHYSICS LETTERS

High mobility indium free amorphous oxide thin film transistors

(2008) Elvira M. C. Fortunato et al.   APPLIED PHYSICS LETTERS

Analysis of the off current in nanocrystalline silicon bottom-gate thin-film transistors

(2008) Mohammad R. Esmaeili-Rad et al.   JOURNAL OF APPLIED PHYSICS

Charge trapping and detrapping characteristics in amorphous InGaZnO TFTs under static and dynamic stresses

(2008) In-Tak Cho et al.   SEMICONDUCTOR SCIENCE AND TECHNOLOGY