Trap density probing on top-gate MoS2nanosheet field-effect transistors by photo-excited charge collection spectroscopy
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Title
Trap density probing on top-gate MoS2nanosheet field-effect transistors by photo-excited charge collection spectroscopy
Authors
Keywords
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Journal
Nanoscale
Volume 7, Issue 13, Pages 5617-5623
Publisher
Royal Society of Chemistry (RSC)
Online
2015-02-27
DOI
10.1039/c4nr06707j
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