Degradation Evaluation of $\alpha$-IGZO TFTs for Application to AM-OLEDs

Origin of definite Hall voltage and positive slope in mobility-donor density relation in disordered oxide semiconductors

(2010) Toshio Kamiya et al.   APPLIED PHYSICS LETTERS

Environment-dependent metastability of passivation-free indium zinc oxide thin film transistor after gate bias stress

(2009) Po-Tsun Liu et al.   APPLIED PHYSICS LETTERS

Electrical Instability of a-In–Ga–Zn–O TFTs Biased Below Accumulation Threshold

(2009) Denis Stryakhilev et al.   ELECTROCHEMICAL AND SOLID STATE LETTERS

Constant-Voltage-Bias Stress Testing of a-IGZO Thin-Film Transistors

(2009) Ken Hoshino et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Electrical Instability of RF Sputter Amorphous In-Ga-Zn-O Thin-Film Transistors

(2009) Tze-Ching Fung et al.   Journal of Display Technology

Instability dependent upon bias and temperature stress in amorphous-indium gallium zinc oxide (a-IGZO) thin-film transistors

(2009) Kwang-Il Choi et al.   Journal of the Society for Information Display

Comprehensive studies on the stabilities of a-In-Ga-Zn-O based thin film transistor by constant current stress

(2009) Kenji Nomura et al.   THIN SOLID FILMS

Origin of threshold voltage instability in indium-gallium-zinc oxide thin film transistors

(2008) Jae Kyeong Jeong et al.   APPLIED PHYSICS LETTERS

Trap densities in amorphous-InGaZnO4 thin-film transistors

(2008) Mutsumi Kimura et al.   APPLIED PHYSICS LETTERS

Processing effects on the stability of amorphous indium gallium zinc oxide thin-film transistors

(2008) Hai Q. Chiang et al.   JOURNAL OF NON-CRYSTALLINE SOLIDS