Applicability of focused Ion beam (FIB) milling with gallium, neon, and xenon to the fracture toughness characterization of gold thin films
出版年份 2021 全文链接
标题
Applicability of focused Ion beam (FIB) milling with gallium, neon, and xenon to the fracture toughness characterization of gold thin films
作者
关键词
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出版物
JOURNAL OF MATERIALS RESEARCH
Volume -, Issue -, Pages -
出版商
Springer Science and Business Media LLC
发表日期
2021-02-19
DOI
10.1557/s43578-020-00045-w
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