FIB-induced dislocations in Al submicron pillars: Annihilation by thermal annealing and effects on deformation behavior

出版年份 2016 全文链接

标题

作者

关键词

Focused ion beam, Aluminum, Dislocations, Annealing, In–situ transmission electron microscopy, Slip bursts

出版物

Volume 110, Issue -, Pages 283-294

出版商

Elsevier BV

发表日期

2016-03-24

DOI

10.1016/j.actamat.2016.03.017

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