Towards reliable X-ray photoelectron spectroscopy: Sputter-damage effects in transition metal borides, carbides, nitrides, and oxides
出版年份 2020 全文链接
标题
Towards reliable X-ray photoelectron spectroscopy: Sputter-damage effects in transition metal borides, carbides, nitrides, and oxides
作者
关键词
XPS, Photoelectron spectroscopy, Sputter damage, Ion etching, Thin films
出版物
APPLIED SURFACE SCIENCE
Volume 542, Issue -, Pages 148599
出版商
Elsevier BV
发表日期
2020-11-28
DOI
10.1016/j.apsusc.2020.148599
参考文献
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注意:仅列出部分参考文献,下载原文获取全部文献信息。- Proliferation of Faulty Materials Data Analysis in the Literature
- (2020) Matthew R. Linford et al. MICROSCOPY AND MICROANALYSIS
- The use and misuse of curve fitting in the analysis of core X-ray photoelectron spectroscopic data
- (2019) Peter M.A. Sherwood SURFACE AND INTERFACE ANALYSIS
- Practical guides for x-ray photoelectron spectroscopy: First steps in planning, conducting, and reporting XPS measurements
- (2019) Donald R. Baer et al. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A
- Argon Embedded by Ion Bombardment: Relevance of Hidden Dopants in Rutile TiO2
- (2019) Lars Mohrhusen et al. Journal of Physical Chemistry C
- X-ray photoelectron spectroscopy: towards reliable binding energy referencing
- (2019) G. Greczynski et al. PROGRESS IN MATERIALS SCIENCE
- An XPS/UPS study of the surface/near-surface bonding in nuclear grade graphites: A comparison of monatomic and cluster depth-profiling techniques
- (2019) Alex Theodosiou et al. APPLIED SURFACE SCIENCE
- Reliable determination of chemical state in x-ray photoelectron spectroscopy based on sample-work-function referencing to adventitious carbon: Resolving the myth of apparent constant binding energy of the C 1s peak
- (2018) G. Greczynski et al. APPLIED SURFACE SCIENCE
- Reference binding energies of transition metal carbides by core-level x -ray photoelectron spectroscopy free from Ar + etching artefacts
- (2018) G. Greczynski et al. APPLIED SURFACE SCIENCE
- Spectral artefacts post sputter-etching and how to cope with them – A case study of XPS on nitride-based coatings using monoatomic and cluster ion beams
- (2018) Erik Lewin et al. APPLIED SURFACE SCIENCE
- Repair of defects created by Ar+ sputtering on graphite surface by annealing as confirmed using ToF-SIMS and XPS
- (2018) Wenjing Xie et al. SURFACE AND INTERFACE ANALYSIS
- Control over the Phase Formation in Metastable Transition Metal Nitride Thin Films by Tuning the Al+ Subplantation Depth
- (2018) Grzegorz Greczynski et al. Coatings
- Sample rotation improves gas cluster sputter depth profiling of polymers
- (2017) Emily F. Smith et al. SURFACE AND INTERFACE ANALYSIS
- In-situ observation of self-cleansing phenomena during ultra-high vacuum anneal of transition metal nitride thin films: Prospects for non-destructive photoelectron spectroscopy
- (2016) G. Greczynski et al. APPLIED PHYSICS LETTERS
- Venting temperature determines surface chemistry of magnetron sputtered TiN films
- (2016) G. Greczynski et al. APPLIED PHYSICS LETTERS
- Self-consistent modelling of X-ray photoelectron spectra from air-exposed polycrystalline TiN thin films
- (2016) G. Greczynski et al. APPLIED SURFACE SCIENCE
- XPS study of the effects of long-term Ar+ ion and Ar cluster sputtering on the chemical degradation of hydrozincite and iron oxide
- (2015) R. Steinberger et al. CORROSION SCIENCE
- Al capping layers for nondestructive x-ray photoelectron spectroscopy analyses of transition-metal nitride thin films
- (2015) Grzegorz Greczynski et al. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A
- Observed damage during Argon gas cluster depth profiles of compound semiconductors
- (2014) Anders J. Barlow et al. JOURNAL OF APPLIED PHYSICS
- XPS studies on surface reduction of tungsten oxide nanowire film by Ar+ bombardment
- (2012) F.Y. Xie et al. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
- Resolving surface chemical states in XPS analysis of first row transition metals, oxides and hydroxides: Sc, Ti, V, Cu and Zn
- (2010) Mark C. Biesinger et al. APPLIED SURFACE SCIENCE
- Resolving surface chemical states in XPS analysis of first row transition metals, oxides and hydroxides: Cr, Mn, Fe, Co and Ni
- (2010) Mark C. Biesinger et al. APPLIED SURFACE SCIENCE
- X-ray photoelectron spectroscopy study of polyimide thin films with Ar cluster ion depth profiling
- (2010) T. Miyayama et al. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A
- Calculations of electron inelastic mean free paths. IX. Data for 41 elemental solids over the 50 eV to 30 keV range
- (2010) S. Tanuma et al. SURFACE AND INTERFACE ANALYSIS
- Influence of sputter damage on the XPS analysis of metastable nanocomposite coatings
- (2009) Erik Lewin et al. SURFACE & COATINGS TECHNOLOGY
- Surface sensitivity of X-ray photoelectron spectroscopy
- (2008) C.J. Powell et al. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
- Electronic structure of cubic HfxTa1–xCy carbides from X-ray spectroscopy studies and cluster self-consistent calculations
- (2007) A.A. Lavrentyev et al. JOURNAL OF ALLOYS AND COMPOUNDS
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