Repair of defects created by Ar+ sputtering on graphite surface by annealing as confirmed using ToF-SIMS and XPS

标题
Repair of defects created by Ar+ sputtering on graphite surface by annealing as confirmed using ToF-SIMS and XPS
作者
关键词
-
出版物
SURFACE AND INTERFACE ANALYSIS
Volume -, Issue -, Pages -
出版商
Wiley
发表日期
2018-07-06
DOI
10.1002/sia.6487

向作者/读者发起求助以获取更多资源

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started