Ultra-thin Hf0.5Zr0.5O2 thin-film-based ferroelectric tunnel junction via stress induced crystallization
出版年份 2020 全文链接
标题
Ultra-thin Hf0.5Zr0.5O2 thin-film-based ferroelectric tunnel junction via stress induced crystallization
作者
关键词
-
出版物
APPLIED PHYSICS LETTERS
Volume 117, Issue 24, Pages 242901
出版商
AIP Publishing
发表日期
2020-12-14
DOI
10.1063/5.0029516
参考文献
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