The effects of crystallographic orientation and strain of thin Hf0.5Zr0.5O2 film on its ferroelectricity
出版年份 2014 全文链接
标题
The effects of crystallographic orientation and strain of thin Hf0.5Zr0.5O2 film on its ferroelectricity
作者
关键词
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出版物
APPLIED PHYSICS LETTERS
Volume 104, Issue 7, Pages 072901
出版商
AIP Publishing
发表日期
2014-02-19
DOI
10.1063/1.4866008
参考文献
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注意:仅列出部分参考文献,下载原文获取全部文献信息。- Effect of forming gas annealing on the ferroelectric properties of Hf0.5Zr0.5O2 thin films with and without Pt electrodes
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- (2011) An Quan Jiang et al. ADVANCED MATERIALS
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- (2011) T. S. Böscke et al. APPLIED PHYSICS LETTERS
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