Review of Present Reliability Challenges in Amorphous In-Ga-Zn-O Thin Film Transistors
出版年份 2014 全文链接
标题
Review of Present Reliability Challenges in Amorphous In-Ga-Zn-O Thin Film Transistors
作者
关键词
-
出版物
ECS Journal of Solid State Science and Technology
Volume 3, Issue 9, Pages Q3058-Q3070
出版商
The Electrochemical Society
发表日期
2014-08-13
DOI
10.1149/2.013409jss
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