Strain measurement at the nanoscale: Comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography

标题
Strain measurement at the nanoscale: Comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography
作者
关键词
-
出版物
ULTRAMICROSCOPY
Volume 131, Issue -, Pages 10-23
出版商
Elsevier BV
发表日期
2013-04-06
DOI
10.1016/j.ultramic.2013.03.014

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