Multiwavelength anomalous diffraction and diffraction anomalous fine structure to study composition and strain of semiconductor nanostructures

Title
Multiwavelength anomalous diffraction and diffraction anomalous fine structure to study composition and strain of semiconductor nanostructures
Authors
Keywords
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Journal
European Physical Journal-Special Topics
Volume 208, Issue 1, Pages 189-216
Publisher
Springer Nature
Online
2012-06-18
DOI
10.1140/epjst/e2012-01619-x

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