Impact of Engineered Ti Layer on the Memory Performance of HfO[sub x]-Based Resistive Memory

Title
Impact of Engineered Ti Layer on the Memory Performance of HfO[sub x]-Based Resistive Memory
Authors
Keywords
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Journal
ELECTROCHEMICAL AND SOLID STATE LETTERS
Volume 13, Issue 12, Pages H423
Publisher
The Electrochemical Society
Online
2010-09-18
DOI
10.1149/1.3489079

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