Direct imaging of electron recombination and transport on a semiconductor surface by femtosecond time-resolved photoemission electron microscopy

An extended defect as a sensor for free carrier diffusion in a semiconductor

(2013) T. H. Gfroerer et al.   APPLIED PHYSICS LETTERS

Energy-resolved magnetic domain imaging in TbCo alloys by valence band photoemission magnetic circular dichroism

(2013) Pascal Melchior et al.   PHYSICAL REVIEW B

Nanoscale probing of transient carrier dynamics modulated in a GaAs–PIN junction by laser-combined scanning tunneling microscopy

(2012) Shoji Yoshida et al.   Nanoscale

Tracing Ultrafast Separation and Coalescence of Carrier Distributions in Graphene with Time-Resolved Photoemission

(2011) Steve Gilbertson et al.   Journal of Physical Chemistry Letters

4D Scanning Ultrafast Electron Microscopy: Visualization of Materials Surface Dynamics

(2011) Omar F. Mohammed et al.   JOURNAL OF THE AMERICAN CHEMICAL SOCIETY

Correlation of band edge native defect state evolution to bulk mobility changes in ZnO thin films

(2010) Hyungtak Seo et al.   APPLIED PHYSICS LETTERS

Spatiotemporal control of nanooptical excitations

(2010) M. Aeschlimann et al.   PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA

Nanosilicon photonics

(2009) N. Daldosso et al.   Laser & Photonics Reviews

Ultrafast high-field carrier transport in GaAs measured by femtosecond pump-terahertz probe spectroscopy

(2008) Yulei Shi et al.   APPLIED PHYSICS LETTERS

Ultrafast Time Dependence of Surface Photo-Voltage Effect onp-Type GaAs(100) Surface

(2008) Shinji Tokudomi et al.   JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN

Auger recombination in silicon nanocrystals embedded in SiO2wide band-gap lattice

(2008) M. Mahdouani et al.   PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE