An extended defect as a sensor for free carrier diffusion in a semiconductor

Published 2013 View Full Article

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Title
An extended defect as a sensor for free carrier diffusion in a semiconductor
Authors
Keywords
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Journal
APPLIED PHYSICS LETTERS
Volume 102, Issue 1, Pages 012114
Publisher
AIP Publishing
Online
2013-01-13
DOI
10.1063/1.4775369
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