Correlation of band edge native defect state evolution to bulk mobility changes in ZnO thin films

Published 2010 View Full Article

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Title
Correlation of band edge native defect state evolution to bulk mobility changes in ZnO thin films
Authors
Keywords
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Journal
APPLIED PHYSICS LETTERS
Volume 96, Issue 23, Pages 232101
Publisher
AIP Publishing
Online
2010-06-08
DOI
10.1063/1.3424790
References
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