Tungsten oxide proton conducting films for low-voltage transparent oxide-based thin-film transistors

Design rules of (Mg,Zn)O-based thin-film transistors with high-κ WO3 dielectric gates

(2012) M. Lorenz et al.   APPLIED PHYSICS LETTERS

Thin Transparent W-Doped Indium-Zinc Oxide (WIZO) Layer on Glass

(2012) Young-Jun Lee et al.   JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY

Tungsten Oxide as a Gate Dielectric for Highly Transparent and Temperature-Stable Zinc-Oxide-Based Thin-Film Transistors

(2011) Michael Lorenz et al.   ADVANCED MATERIALS

Suppression in the negative bias illumination instability of Zn-Sn-O transistor using oxygen plasma treatment

(2011) Shinhyuk Yang et al.   APPLIED PHYSICS LETTERS

Combinatorial study of WInZnO films deposited by rf magnetron co-sputtering

(2011) Byeong-Yun Oh et al.   JOURNAL OF SOLID STATE CHEMISTRY

The Effects of Moisture in Low-Voltage Organic Field-Effect Transistors Gated with a Hydrous Solid Electrolyte

(2010) Nikolai Kaihovirta et al.   ADVANCED FUNCTIONAL MATERIALS

O-vacancy as the origin of negative bias illumination stress instability in amorphous In–Ga–Zn–O thin film transistors

(2010) Byungki Ryu et al.   APPLIED PHYSICS LETTERS

Improvement in the photon-induced bias stability of Al–Sn–Zn–In–O thin film transistors by adopting AlOx passivation layer

(2010) Shinhyuk Yang et al.   APPLIED PHYSICS LETTERS

Mesoporous, high-surface-area tungsten oxide monoliths with mixed electron/proton conductivity

(2010) Gabriele Orsini et al.   JOURNAL OF MATERIALS CHEMISTRY

Insulator Polarization Mechanisms in Polyelectrolyte-Gated Organic Field-Effect Transistors

(2009) Oscar Larsson et al.   ADVANCED FUNCTIONAL MATERIALS

Self-Supported Ion-Conductive Membrane-Based Transistors

(2009) Nikolai J. Kaihovirta et al.   ADVANCED MATERIALS

The effect of moisture on the photon-enhanced negative bias thermal instability in Ga–In–Zn–O thin film transistors

(2009) Kwang-Hee Lee et al.   APPLIED PHYSICS LETTERS

High-Capacitance Ion Gel Gate Dielectrics with Faster Polarization Response Times for Organic Thin Film Transistors

(2008) J. H. Cho et al.   ADVANCED MATERIALS

Bias stress stability of indium gallium zinc oxide channel based transparent thin film transistors

(2008) A. Suresh et al.   APPLIED PHYSICS LETTERS