Investigation of an anomalous hump in gate current after negative-bias temperature-instability in HfO2/metal gate p-channel metal-oxide-semiconductor field-effect transistors

Charge trapping induced drain-induced-barrier-lowering in HfO2/TiN p-channel metal-oxide-semiconductor-field-effect-transistors under hot carrier stress

(2012) Wen-Hung Lo et al.   APPLIED PHYSICS LETTERS

Impact of Mechanical Strain on GIFBE in PD SOI p-MOSFETs as Indicated From NBTI Degradation

(2012) Wen-hung Lo et al.   IEEE ELECTRON DEVICE LETTERS

Insight Into N/PBTI Mechanisms in Sub-1-nm-EOT Devices

(2012) Moonju Cho et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Hot carrier effect on gate-induced drain leakage current in high-k/metal gate n-channel metal-oxide-semiconductor field-effect transistors

(2011) Chih-Hao Dai et al.   APPLIED PHYSICS LETTERS

Impact of static and dynamic stress on threshold voltage instability in high-k/metal gate n-channel metal-oxide-semiconductor field-effect transistors

(2011) Chih-Hao Dai et al.   APPLIED PHYSICS LETTERS

On the Origin of Gate-Induced Floating-Body Effect in PD SOI p-MOSFETs

(2011) Chih-Hao Dai et al.   IEEE ELECTRON DEVICE LETTERS

Impacts of Zr Composition in $\hbox{Hf}_{1-x} \hbox{Zr}_{x}\hbox{O}_{y}$ Gate Dielectrics on Their Crystallization Behavior and Bias-Temperature-Instability Characteristics

(2011) Hyung-Suk Jung et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Charge trapping induced frequency-dependence degradation in n-MOSFETs with high-k/metal gate stacks

(2011) Chih-Hao Dai et al.   THIN SOLID FILMS

Enhanced gate-induced floating-body effect in PD SOI MOSFET under external mechanical strain

(2010) Chih-Hao Dai et al.   SURFACE & COATINGS TECHNOLOGY

Temperature-Dependent Biaxial Compressive Strain Effect on p-MOSFETs

(2008) Yuan-Jui Kuo et al.   ELECTROCHEMICAL AND SOLID STATE LETTERS

Substrate current enhancement in 65 nm metal-oxide-silicon field-effect transistor under external mechanical stress

(2008) Y.J. Kuo et al.   THIN SOLID FILMS