Large-area microfocal spectroscopic ellipsometry mapping of thickness and electronic properties of epitaxial graphene on Si- and C-face of 3C-SiC(111)
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Title
Large-area microfocal spectroscopic ellipsometry mapping of thickness and electronic properties of epitaxial graphene on Si- and C-face of 3C-SiC(111)
Authors
Keywords
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Journal
APPLIED PHYSICS LETTERS
Volume 102, Issue 21, Pages 213116
Publisher
AIP Publishing
Online
2013-06-01
DOI
10.1063/1.4808379
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