Microscopic thickness determination of thin graphite films formed onSiCfrom quantized oscillation in reflectivity of low-energy electrons

Published 2008 View Full Article

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Title
Microscopic thickness determination of thin graphite films formed onSiCfrom quantized oscillation in reflectivity of low-energy electrons
Authors
Keywords
-
Journal
PHYSICAL REVIEW B
Volume 77, Issue 7, Pages -
Publisher
American Physical Society (APS)
Online
2008-02-16
DOI
10.1103/physrevb.77.075413

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